IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
Images may differ
Available: 206 pcs.
Next delivery: 3276 pcs.
Manufacturer Leadtime: **
Description
The SN74BCT8374ADWR is a common industry Specialty Logic housed in a RoHS compliant 24-SOIC (0.295", 7.50mm Width) package by Texas Instruments made. The SN74BCT8374ADWR is using SPQ 2000 pieces and MSL1 packing size. Buy new and original item from Innovo Technology distributor, contact by email: sales@hk-innovo.com
Technical specifications
Mfr | Texas Instruments |
Series | 74BCT |
Package | Tape & Reel (TR) |
Product Status | Obsolete |
Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
Supply Voltage | 4.5V ~ 5.5V |
Number of Bits | 8 |
Operating Temperature | 0°C ~ 70°C |
Mounting Type | Surface Mount |
Package / Case | 24-SOIC (0.295", 7.50mm Width) |
Supplier Device Package | 24-SOIC |
Base Product Number | 74BCT8374 |
Logistics
Country of origin | HK |
Customs tariff number | - |
Original Packaging | Reel with 2000 pieces |
Compliance
RoHS conform | Yes |
HTSUS | 8504.40.9580 |
SVHC free | Yes |
Search
SN74BCT8374ADWR ECAD module
SN74BCT8374ADWR datesheet
SN74BCT8374ADWR specification
SN74BCT8374ADWR certificate
SN74BCT8374ADWR component
SN74BCT8374ADWR substitute
SN74BCT8374ADWR packaging