IC SCAN TEST DEVICE W/FF 24-DIP | Texas Instruments
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-PDIP
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Available: 206 pcs.
Next delivery: 3276 pcs.
Manufacturer Leadtime: **
Description
The SN74BCT8374ANTG4 is a common industry Specialty Logic housed in a RoHS compliant 24-DIP (0.300", 7.62mm) package by Texas Instruments made. The SN74BCT8374ANTG4 is using SPQ 60 pieces and MSL1 packing size. Buy new and original item from Innovo Technology distributor, contact by email: sales@hk-innovo.com
Technical specifications
Mfr | Texas Instruments |
Series | 74BCT |
Package | Tube |
Product Status | Obsolete |
Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
Supply Voltage | 4.5V ~ 5.5V |
Number of Bits | 8 |
Operating Temperature | 0°C ~ 70°C |
Mounting Type | Through Hole |
Package / Case | 24-DIP (0.300", 7.62mm) |
Supplier Device Package | 24-PDIP |
Base Product Number | 74BCT8374 |
Logistics
Country of origin | HK |
Customs tariff number | - |
Original Packaging | Reel with 60 pieces |
Compliance
RoHS conform | Yes |
HTSUS | 8504.40.9580 |
SVHC free | Yes |
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